for you to see more, deeper, more accurate! Large Depth Subsurface Defects \n DC100 confocal microscope is a new generation of high-end stereo microscopic measuring instrument developed by Spectra Sima Instruments. It is a high-end three-dimensional microscopic instrument with both surface topography measurement and sub-surface defect detection capabilities. It can be widely used for surface quality detection such as roughness and cracks in the field of metal processing, and for microstructure three-dimensional size and sub-surface defect detection in the field of semiconductor devices, MEMS components, photovoltaic panels, ultra-precision parts and LED, optical surface profile measurement and sub-surface defect detection in the field of advanced optical processing, material surface structure characterization in the field of material manufacturing and research and development, etc.<\/span><\/span><\/p>\n \n \n fusion of three measurement methods in one<\/strong><\/span><\/span><\/p>\n \n \n multi-modal measurement (optional)<\/strong> \n \n brightfield confocal imaging<\/strong> \n \n dark-field confocal imaging<\/strong> \n \n three-dimensional true color imaging<\/strong> \n \n Simplifies the measurement process<\/strong> \n autofocus<\/strong> \n \n simple image processing<\/strong> \n \n morphology filtering<\/strong>: Filter out abnormal measurement points and reduce noise interference on data<\/span><\/span><\/p>\n \n \n image mosaic<\/strong>: Combined with the position data of the displacement stage, large sample measurement is realized by image stitching<\/span><\/span><\/p>\n \n \n Intuitive Image Analysis<\/strong><\/span><\/p>\n \n \n \n \n \n \n \n Typical application scenarios<\/strong> \n \n \n<\/div>\n <\/p>","protected":false},"excerpt":{"rendered":" for you to see more, deeper, more accurate! High-precision laser confocal measurement of three-dimensional surface topography Large Depth Subsurface Defects Sub-surface detection depth up to 100 \u03bcm! DC100 confocal microscope is a new generation of high-end stereo microscopic measuring instrument developed by Spectra Sima Instruments. It is a high-end three-dimensional microscopic instrument with both surface […]<\/p>\n","protected":false},"author":1,"featured_media":7306,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[110],"tags":[],"class_list":["post-7177","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-fdr"],"_links":{"self":[{"href":"http:\/\/www.prtinst.com\/index.php?rest_route=\/wp\/v2\/posts\/7177"}],"collection":[{"href":"http:\/\/www.prtinst.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"http:\/\/www.prtinst.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"http:\/\/www.prtinst.com\/index.php?rest_route=\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"http:\/\/www.prtinst.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=7177"}],"version-history":[{"count":7,"href":"http:\/\/www.prtinst.com\/index.php?rest_route=\/wp\/v2\/posts\/7177\/revisions"}],"predecessor-version":[{"id":7328,"href":"http:\/\/www.prtinst.com\/index.php?rest_route=\/wp\/v2\/posts\/7177\/revisions\/7328"}],"wp:featuredmedia":[{"embeddable":true,"href":"http:\/\/www.prtinst.com\/index.php?rest_route=\/wp\/v2\/media\/7306"}],"wp:attachment":[{"href":"http:\/\/www.prtinst.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=7177"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"http:\/\/www.prtinst.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=7177"},{"taxonomy":"post_tag","embeddable":true,"href":"http:\/\/www.prtinst.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=7177"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}
\nHigh-precision laser confocal measurement of three-dimensional surface topography<\/span><\/span><\/p>\n
\nSub-surface detection depth up to 100 \u03bcm!<\/span><\/span><\/p>\n![\"\"](\"\/product_imgs\/2501798\/51232503.png\")
<\/span><\/span><\/p>\n![\"\"](\"\/product_imgs\/2501798\/48418250.png\")
<\/span><\/span><\/p>\n![\"\"](\"\/product_imgs\/2501798\/48418252.png\")
<\/strong><\/span><\/span><\/p>\n
\nFusion of confocal bright field, confocal dark field, three-dimensional true color and thermal wave imaging methods to obtain more abundant information on the sample surface and subsurface<\/span><\/span><\/p>\n![\"\"](\"\/product_imgs\/2501798\/48418255.png\")
<\/span><\/span><\/p>\n
\nPoint illumination and point detection realize the separation of quasi-focus and out-of-focus signals, and realize three-dimensional imaging.
\nHigh-sensitivity confocal peak positioning algorithm to achieve nanoscale axial resolution<\/span><\/span><\/p>\n![\"\"](\"\/product_imgs\/2501798\/48418257.png\")
<\/span><\/span><\/p>\n
\nThrough the ring light shaping module and complementary aperture, the surface reflected light and sub-surface scattered light are separated, and the three-dimensional distribution information of sub-surface defects is obtained.<\/span><\/span><\/p>\n![\"\"](\"\/product_imgs\/2501798\/48418260.png\")
<\/span><\/span><\/p>\n
\nTake sample photos along the Z direction, judge the Z position of each pixel according to the clarity, and obtain the sample shape data containing real colors.<\/span><\/span><\/p>\n![\"\"](\"\/product_imgs\/2501798\/48418263.png\")
<\/span><\/span><\/p>\n
\nFull Range Map Navigation
\nThe area captured by a single shot can be displayed and recorded on the map, which is convenient for users to find out the whole picture of the sample. Click the mouse in the map to make the displacement stage move the area corresponding to the sample to the center of the picture.<\/span><\/span>
\n<\/p>\n![\"\"](\"\/product_imgs\/2501798\/48418267.png\")
<\/p>\n
\nThe automatic focusing function of the microscope makes it possible to reduce the manual adjustment operation as much as possible during the measurement process, and can quickly and easily obtain a clear in-focus image<\/span><\/span><\/p>\n![\"\"](\"\/product_imgs\/2501798\/48418272.png\")
<\/span><\/span><\/p>\n
\nTilt correction: solve the problem of tilting the measured area and make the height information more accurate and clear<\/span><\/span><\/p>\n![\"\"](\"\/product_imgs\/2501798\/48418288.png\")
<\/p>\n![\"\"](\"\/product_imgs\/2501798\/48418286.png\")
<\/span><\/span><\/p>\n![\"\"](\"\/product_imgs\/2501798\/48418293.png\")
<\/span><\/span><\/p>\n![\"\"](\"\/product_imgs\/2501798\/48418296.png\")
<\/strong><\/span><\/p>\n![\"\"](\"\/product_imgs\/2501798\/48418297.png\")
<\/p>\n![\"\"](\"\/product_imgs\/2501798\/48418300.png\")
<\/p>\n![\"\"](\"\/product_imgs\/2501798\/48418301.png\")
<\/p>\n![\"\"](\"\/product_imgs\/2501798\/48418307.png\")
<\/p>\n![\"\"](\"\/product_imgs\/2501798\/48418308.png\")
<\/p>\n![\"\"](\"\/product_imgs\/2501798\/48418309.png\")
<\/p>\n
\nThis microscope can be used as an observation and analysis instrument for scientific research departments and production units, and is also an ideal instrument for assisting precision micro-nano processing and semiconductor production research and development. It can be widely used in metal materials, integrated circuits, electronic chips, optical glass and other shape measurement and defect detection.<\/span><\/span><\/p>\n![\"\"](\"\/product_imgs\/2501798\/48418311.png\")
<\/span><\/span><\/p>\n![\"\"](\"\/product_imgs\/2501798\/48418312.png\")
<\/span><\/span><\/p>\n