industrial confocal microscope CREATIVE DC100

for you to see more, deeper, more accurate!

High-precision laser confocal measurement of three-dimensional surface topography

Large Depth Subsurface Defects

Sub-surface detection depth up to 100 μm!

DC100 confocal microscope is a new generation of high-end stereo microscopic measuring instrument developed by Spectra Sima Instruments. It is a high-end three-dimensional microscopic instrument with both surface topography measurement and sub-surface defect detection capabilities. It can be widely used for surface quality detection such as roughness and cracks in the field of metal processing, and for microstructure three-dimensional size and sub-surface defect detection in the field of semiconductor devices, MEMS components, photovoltaic panels, ultra-precision parts and LED, optical surface profile measurement and sub-surface defect detection in the field of advanced optical processing, material surface structure characterization in the field of material manufacturing and research and development, etc.

fusion of three measurement methods in one

multi-modal measurement (optional)

Fusion of confocal bright field, confocal dark field, three-dimensional true color and thermal wave imaging methods to obtain more abundant information on the sample surface and subsurface

brightfield confocal imaging

Point illumination and point detection realize the separation of quasi-focus and out-of-focus signals, and realize three-dimensional imaging.

High-sensitivity confocal peak positioning algorithm to achieve nanoscale axial resolution

dark-field confocal imaging

Through the ring light shaping module and complementary aperture, the surface reflected light and sub-surface scattered light are separated, and the three-dimensional distribution information of sub-surface defects is obtained.

three-dimensional true color imaging

Take sample photos along the Z direction, judge the Z position of each pixel according to the clarity, and obtain the sample shape data containing real colors.

Simplifies the measurement process

Full Range Map Navigation

The area captured by a single shot can be displayed and recorded on the map, which is convenient for users to find out the whole picture of the sample. Click the mouse in the map to make the displacement stage move the area corresponding to the sample to the center of the picture.

autofocus

The automatic focusing function of the microscope makes it possible to reduce the manual adjustment operation as much as possible during the measurement process, and can quickly and easily obtain a clear in-focus image

simple image processing

Tilt correction: solve the problem of tilting the measured area and make the height information more accurate and clear

morphology filtering: Filter out abnormal measurement points and reduce noise interference on data

image mosaic: Combined with the position data of the displacement stage, large sample measurement is realized by image stitching

Intuitive Image Analysis

Typical application scenarios

This microscope can be used as an observation and analysis instrument for scientific research departments and production units, and is also an ideal instrument for assisting precision micro-nano processing and semiconductor production research and development. It can be widely used in metal materials, integrated circuits, electronic chips, optical glass and other shape measurement and defect detection.